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Characterization, Testing, Measurement, and Metrology

Characterization, Testing, Measurement, and Metrology

Chander Prakash, Sunpreet Singh, J. Paulo Davim
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This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices through advanced manufacturing processes and also a comprehensive treatise of various operational principles, scientific tools, technical methodologies, and qualitative/quantitative characteristics involved in the scientific world. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years.

The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems.

The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.

年:
2020
出版社:
Taylor & Francis Group
语言:
english
页:
205
ISBN 10:
0429298072
ISBN 13:
9780429298073
文件:
PDF, 24.80 MB
IPFS:
CID , CID Blake2b
english, 2020
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