募捐 9月15日2024 – 10月1日2024 关于筹款

Machine Vision Inspection Systems, Machine Learning-Based...

Machine Vision Inspection Systems, Machine Learning-Based Approaches

Muthukumaran Malarvel, Soumya Ranjan Nayak, Prasant Kumar Pattnaik, Surya Narayan Panda
你有多喜欢这本书?
下载文件的质量如何?
下载该书,以评价其质量
下载文件的质量如何?

Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Now a day's the current research on machine inspection gained more popularity among various researchers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examining while inspection process.

This volume 2 covers machine learning-based approaches in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), natural language processing, medical diagnosis, etc. This edited book is designed to address various aspects of recent methodologies, concepts, and research plan out to the readers for giving more depth insights for perusing research on machine vision using machine learning-based approaches.

种类:
卷:
2
年:
2021
出版社:
John Wiley & Sons
语言:
english
页:
352
ISBN 10:
1119786096
ISBN 13:
9781119786092
文件:
PDF, 39.87 MB
IPFS:
CID , CID Blake2b
english, 2021
线上阅读
正在转换
转换为 失败

关键词