Test and Diagnosis for Small-Delay Defects
Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty (auth.)This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
种类:
年:
2012
出版:
1
出版社:
Springer-Verlag New York
语言:
english
页:
212
ISBN 10:
1441982973
ISBN 13:
9781441982971
文件:
PDF, 5.78 MB
IPFS:
,
english, 2012
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