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Reliability Investigation of LED Devices for Public Light...

Reliability Investigation of LED Devices for Public Light Applications

Raphael Baillot and Yannick Deshayes (Auth.)
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Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications.

Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models.

The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved.

种类:
年:
2017
出版:
1st Edition
出版社:
ISTE Press - Elsevier
语言:
english
页:
222
ISBN 13:
9780081010921
文件:
PDF, 24.49 MB
IPFS:
CID , CID Blake2b
english, 2017
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