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Advanced Nanoscale ULSI Interconnects: Fundamentals and...

Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications

Y. Shacham-Diamand (auth.), Yosi Shacham-Diamand, Tetsuya Osaka, Madhav Datta, Takayuki Ohba (eds.)
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Advanced Nanoscale ULSI Interconnects: Fundamental and Applications brings a comprehensive description of copper based interconnect technology for Ultra Large Scale Integration (ULSI) technology to Integrated Circuit (ICs) application. This book reviews the basic technologies used today for the copper metallization of ULSI applications: deposition and planarization. It describes the materials used, their properties, and the way they are all integrated, specifically in regard to the copper integration processes and electrochemical processes in the nanoscale regime. The book also presents various novel nanoscale technologies that will link modern nanoscale electronics to future nanoscale based systems. This diverse, multidisciplinary volume will appeal to process engineers in the microelectronics industry; universities with programs in ULSI design, microelectronics, MEMS and nanoelectronics; and professionals in the electrochemical industry working with materials, plating and tool vendors.

年:
2009
出版:
1
出版社:
Springer-Verlag New York
语言:
english
页:
552
ISBN 10:
0387958681
ISBN 13:
9780387958682
文件:
PDF, 23.53 MB
IPFS:
CID , CID Blake2b
english, 2009
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